Bayesian analysis of the sequential inspection plan via the gibbs sampler

Operations Research

Volumn 56, Issue 1, 2008, Pages 235-246

  Chun, Young H ^a  

^a LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

Probability: applications; Reliability: inspection; Statistics: bayesian

Indexed keywords

BAYESIAN METHOD; MULTIPLE INSPECTIONS;

BAYESIAN NETWORKS; MAXIMUM LIKELIHOOD; MONTE CARLO METHODS; PROBABILITY; RELIABILITY;

COMPUTER SOFTWARE;

EID: 41549161476     PISSN: 0030364X     EISSN: 15265463     Source Type: Journal    
DOI: 10.1287/opre.1070.0501     Document Type: Article

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