Serial inspection plan in the presence of inspection errors: Maximum likelihood and maximum entropy approaches

Quality Engineering

Volumn 17, Issue 4, 2005, Pages 627-632

  Chun, Young H ^a  

^a LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

Entropy; Inspections; Product reliability

Indexed keywords

MAXIMUM LIKELIHOOD ESTIMATION; MEASUREMENT ERRORS; PROBABILITY DISTRIBUTIONS; QUALITY CONTROL; RELIABILITY; RELIABILITY THEORY; STATISTICAL PROCESS CONTROL;

INSPECTION ERRORS; MAXIMUM ENTROPY METHOD; PRODUCT RELIABILITY;

INSPECTION;

EID: 28244469088     PISSN: 08982112     EISSN: 15324222     Source Type: Journal    
DOI: 10.1080/08982110500225463     Document Type: Article

References (6)

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