Wave-dispersive x-ray spectrometer for simultaneous acquisition of several characteristic lines based on strongly and accurately shaped Ge crystal

Review of Scientific Instruments

Volumn 79, Issue 3, 2008, Pages

  Hayashi, Kouichi ^a   Nakajima, Kazuo ^a   Fujiwara, Kozo ^a   Nishikata, Susumu ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COVALENT BONDS; DEFORMATION; FLUORESCENCE; GERMANIUM; SILICON WAFERS; SINGLE CRYSTALS; X RAY SPECTROSCOPY;

CHARACTERISTIC LINES; ENERGY RESOLUTION; POSITION-SENSITIVE DETECTORS; X-RAY FIELDS;

X RAY SPECTROMETERS;

EID: 41549152068     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2898406     Document Type: Article

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