|
Volumn , Issue , 2007, Pages 1-6
|
Model based layout pattern dependent metal filling algorithm for improved chip surface uniformity in the copper process
|
Author keywords
[No Author keywords available]
|
Indexed keywords
BOOLEAN FUNCTIONS;
COMPUTER AIDED DESIGN;
COPPER;
COPPER ALLOYS;
DEPOSITS;
DIGITAL INTEGRATED CIRCUITS;
INDUSTRIAL ENGINEERING;
MECHANIZATION;
NANOTECHNOLOGY;
(E ,3E) PROCESS;
(O-SEC.-BUTYLDITHIOCARBONATIO-S ,S') COPPER;
CHIP SURFACES;
CHIP YIELD;
COPPER DAMASCENE PROCESS;
DAMASCENE PROCESSING;
DESIGN AUTOMATION CONFERENCE (DAC);
EXPERIMENTAL RESULTS;
KEY INDICATORS;
METAL FILLING;
MODEL BASED (OPC);
PATTERN DEPENDENT;
PHYSICAL MECHANISMS;
SHARP CONTRAST;
SOUTH PACIFIC;
METALS;
|
EID: 41549101015
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ASPDAC.2007.357783 Document Type: Conference Paper |
Times cited : (31)
|
References (11)
|