Emissivity measurements on electronic microcircuits

Measurement: Journal of the International Measurement Confederation

Volumn 41, Issue 5, 2008, Pages 503-515

  Walach, Tadeusz ^a  

^a RZESZOW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Electronics; Emissivity; Infrared

Indexed keywords

CAMERAS; PRINTED CIRCUIT BOARDS; TEMPERATURE MEASUREMENT; THERMOGRAPHY (IMAGING); THICK FILMS; THIN FILMS;

ELECTRONIC MICROCIRCUITS; EMISSIVITY MEASUREMENTS;

MICROSYSTEMS;

EID: 41449086432     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2007.07.001     Document Type: Article

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