Cost-effective infrared thermography protocol for 40 μm spatial resolution quantitative microelectronic imaging

Infrared Physics and Technology

Volumn 48, Issue 2, 2006, Pages 122-129

  Boué, Christine ^a   Fournier, Danièle ^a  

^a INSTITUT LANGEVIN   (France)

Author keywords

Imaging; Infrared thermography; Microelectronics reliability; Temperature measurement

Indexed keywords

CALIBRATION; CAMERAS; CHEMICAL ANALYSIS; IMAGING TECHNIQUES; INFRARED DEVICES; INTEGRATED CIRCUITS; MODIFICATION; NETWORK PROTOCOLS; OPTICAL RESOLVING POWER; RADIATION; TEMPERATURE; TEMPERATURE MEASUREMENT; THERMOGRAPHY (IMAGING);

ELECTRICAL COMPONENTS; INFRARED THERMOGRAPHY; MICROELECTRONICS RELIABILITY; SOFTWARE CORRECTION;

MICROELECTRONICS;

EID: 33646684550     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infrared.2005.09.004     Document Type: Article

References (6)

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