An approach to accurate measurements of the electrical characteristics of SAW RF filters using neutral test environments

Proceedings of the IEEE Ultrasonics Symposium

Volumn 1, Issue , 2003, Pages 401-406

  Pitschi, F Maximilian ^a   Kiwitt, Jürgen E ^a   Wagner, Karl Ch ^a   Bilzer, Horst ^b   Schuh, Patrick ^b   Menzel, Wolfgang ^b  

^a EPCOS AG   (Germany)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC IMPEDANCE; ACOUSTIC WAVE REFLECTION; ATTENUATION; CODE DIVISION MULTIPLE ACCESS; COMPUTER SIMULATION; INTERFACES (COMPUTER); MAGNETOELECTRIC EFFECTS; MICROPROCESSOR CHIPS; PRINTED CIRCUIT BOARDS; SUBSTRATES; WAVE TRANSMISSION; WIRELESS TELECOMMUNICATION SYSTEMS;

DIELECTRIC LAYERS; DUPLEXERS; IMPEDANCE TRANSFORMATION; RADIO FREQUENCY;

ACOUSTIC SURFACE WAVE FILTERS;

EID: 4143141066     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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