Structural characterization of polysiloxane-derived phases produced during heat treatment

Journal of Molecular Structure

Volumn 704, Issue 1-3, 2004, Pages 259-262

  Gumula, Teresa ^a   Paluszkiewicz, Czeslawa ^a,b   Blazewicz, Marta ^a  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

FTIR spectra; Polysiloxane resin; Raman scattering; Si O C; Silicon carbide

Indexed keywords

CARBON; POLYMETHYLPHENYLSILOXANE; POLYSILOXANE; SILICON DERIVATIVE; SILICON DIOXIDE; UNCLASSIFIED DRUG;

CERAMICS; CHEMICAL STRUCTURE; CONFERENCE PAPER; CRYSTAL; HEAT; INFRARED SPECTROSCOPY; MATERIALS; MORPHOLOGY; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; TEMPERATURE; X RAY DIFFRACTION;

EID: 4143107232     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.molstruc.2003.12.064     Document Type: Conference Paper

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