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Volumn 1, Issue , 2003, Pages 84-87

Spurious resonance free bulk acoustic wave resonators

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC RESONATORS; BANDWIDTH; BOUNDARY CONDITIONS; COSTS; MATRIX ALGEBRA; MICROMACHINING; PIEZOELECTRIC DEVICES; SUBSTRATES; THIN FILMS; WAVE FILTERS;

EID: 4143071647     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (122)

References (3)
  • 1
    • 4143068771 scopus 로고    scopus 로고
    • J. Kaitila et. al.: to be published
    • J. Kaitila et. al.: to be published.
  • 2
    • 0029345324 scopus 로고
    • Analysis of methods for determining electromechanical coupling coefficients of piezoelectric elements
    • July
    • S. H. Chang, N. N. Rogacheva and C. C. Chou, "Analysis of Methods for Determining Electromechanical Coupling Coefficients of Piezoelectric Elements", IEEE Trans. on Ultrasonics, Ferroelectrics, and Freqency Control, Vol. 42, No. 4, July 1995, pp. 630-640.
    • (1995) IEEE Trans. on Ultrasonics, Ferroelectrics, and Freqency Control , vol.42 , Issue.4 , pp. 630-640
    • Chang, S.H.1    Rogacheva, N.N.2    Chou, C.C.3
  • 3
    • 0001736550 scopus 로고    scopus 로고
    • Scanning michelson interferometer for imaging surface acoustic wave fields
    • J. V. Knuuttila, P. T. Tikka and M. M. Salomaa, "Scanning Michelson Interferometer for Imaging Surface Acoustic Wave Fields", Optics Letters, Vol. 25, No. 9, 2000, pp. 613-615.
    • (2000) Optics Letters , vol.25 , Issue.9 , pp. 613-615
    • Knuuttila, J.V.1    Tikka, P.T.2    Salomaa, M.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.