Soft-x-ray spectra of highly charged Kr ions in an electron beam ion trap

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 65, Issue 5, 2002, Pages

  Chen, H ^a   Beiersdorfer, P ^a   Fournier, K B ^a   Trabert E ^a,b,c  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF LIÈGE   (Belgium)

^c RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DOPPLER SHIFTS; ELECTRON-BEAM ENERGY; EXTREME ULTRAVIOLET (EUV) SPECTRA; PLASMA-FACING COMPONENTS (PFC);

ELECTRON BEAMS; IONIZATION; PLASMAS; SPECTROMETERS; ULTRAVIOLET SPECTROSCOPY; X RAY SPECTROSCOPY;

KRYPTON;

EID: 41349120733     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.65.056401     Document Type: Article

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