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Volumn 66, Issue 2, 2002, Pages
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Depinning transition of a driven interface in the random-field Ising model around the upper critical dimension
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
CRYSTAL LATTICES;
LOW TEMPERATURE EFFECTS;
PHASE TRANSITIONS;
REGRESSION ANALYSIS;
THERMAL EXPANSION;
VELOCITY MEASUREMENT;
CRITICAL DIMENSIONS;
DEPINNING TRANSITIONS;
INTERFACE VELOCITY;
THERMAL FLUCTUATIONS;
INTERFACES (MATERIALS);
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EID: 41349087049
PISSN: 1063651X
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevE.66.026127 Document Type: Article |
Times cited : (14)
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References (29)
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