Using Bayesian networks to improve fault diagnosis during manufacturing tests of mobile telephone infrastructure

Journal of the Operational Research Society

Volumn 59, Issue 4, 2008, Pages 423-430

  Chan, A ^a   McNaught, K R ^b  

^a MOTOROLA   (United Kingdom)

^b CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

Bayesian network; Decision support system; Fault diagnosis; Intelligent system; Intelligent user interface; Manufacturing

Indexed keywords

BASE STATIONS; COMPUTER AIDED MANUFACTURING; DECISION SUPPORT SYSTEMS; FAILURE ANALYSIS; GLOBAL SYSTEM FOR MOBILE COMMUNICATIONS; INTELLIGENT SYSTEMS; MARKETING; TELEPHONE SETS;

BASE TRANSCEIVER STATION (BTS); FAULT CORRECTION TIMES; INTELLIGENT USER INTERFACE; UNIVERSAL MOBILE TELECOMMUNICATIONS SYSTEM;

BAYESIAN NETWORKS;

EID: 41149176431     PISSN: 01605682     EISSN: 14769360     Source Type: Journal    
DOI: 10.1057/palgrave.jors.2602388     Document Type: Conference Paper

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