KLn dielectronic recombination process of B- Through He-like Cu ions

Chinese Physics Letters

Volumn 25, Issue 3, 2008, Pages 930-933

  Gao, Ying Hui ^b   Zhang, Xue Mei ^a   Meng, Fan Chang ^b   Chen, Wen Dong ^b   Chen, Chong Yang ^b   Zou, Ya Ming ^b  

^a FUDAN UNIVERSITY   (China)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; TRAPPED IONS;

CHARGED STATE; CU IONS; DIELECTRONIC RECOMBINATION PROCESS; ELECTRON ENERGY RANGE; EXPERIMENTAL SPECTRA; FITTING PARAMETERS; HEIDELBERG ELECTRON BEAM ION TRAPS; RESONANT ENERGY;

HEAVY IONS;

EID: 41149160323     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/25/3/034     Document Type: Article

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