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Volumn 84, Issue 1, 2006, Pages 67-81

Electron-ion interactions for trapped highly charged Ge ions

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON TRAPS; ELECTRONS; IONS;

EID: 33747150175     PISSN: 00084204     EISSN: None     Source Type: Journal    
DOI: 10.1139/P06-004     Document Type: Article
Times cited : (3)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.