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Volumn , Issue , 2007, Pages 90-93
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Towards the determination of typical failure patterns
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Author keywords
Failure location; Failure pattern; Failure causing input
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Indexed keywords
DATA ACQUISITION;
IMAGE ANALYSIS;
PATTERN RECOGNITION;
ADAPTIVE RANDOM TESTING;
FAILURE CAUSING INPUT;
FAILURE PATTERN;
COMPUTER SYSTEM RECOVERY;
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EID: 41149154006
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/1295074.1295091 Document Type: Conference Paper |
Times cited : (38)
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References (15)
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