Impact of the compactness of failure regions on the performance of adaptive random testing

Ruan Jian Xue Bao/Journal of Software

Volumn 17, Issue 12, 2006, Pages 2438-2449

  Chen, Tsong Yueh ^a   Kuo, Fei Ching ^a   Sun, Chang Ai ^a  

^a SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

Adaptive random testing; Failure pattern; Random testing; Software testing

Indexed keywords

ADAPTIVE ALGORITHMS; COMPUTER SOFTWARE MAINTENANCE; FAILURE ANALYSIS; PROGRAM DEBUGGING; RANDOM PROCESSES; REGRESSION ANALYSIS; TESTING;

ADAPTIVE RANDOM TESTING (ART); COMPACTNESS; FAILURE PATTERN; FAILURE REGION; RANDOM TESTING (RT); SOFTWARE TESTING;

SOFTWARE ENGINEERING;

EID: 33846147038     PISSN: 10009825     EISSN: None     Source Type: Journal    
DOI: 10.1360/jos172438     Document Type: Article

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