TOF-SIMS investigations on weathered silver surfaces

Analytical and Bioanalytical Chemistry

Volumn 390, Issue 6, 2008, Pages 1543-1549

  Schnoller J ^a   Wiesinger, R ^a,b   Kleber, C ^a,b   Hilfrich, U ^b   Schreiner, M ^a,b   Hutter, H ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b Akademie der Bildenden Kunste Wien   (Austria)

Author keywords

Corrosion; Depth profiling; QCM; TM AFM; TOF SIMS; Weathering

Indexed keywords

DEPTH PROFILING; OXYGEN; QUARTZ CRYSTAL MICROBALANCES; SECONDARY ION MASS SPECTROMETRY; WEATHERING;

SYNTHETIC AIR; WEATHERED SILVER SURFACES;

SILVER COMPOUNDS;

EID: 41149105471     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-007-1719-8     Document Type: Article

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