Electron microscopy and spectroscopy investigations of CuOx-CeO2-δ/Si thin films

Surface Science

Volumn 602, Issue 7, 2008, Pages 1313-1321

  Kopia, A ^b   Kowalski, K ^b   Chmielowska, M ^a,b   Leroux, Ch ^a  

^a UNIVERSITÉ DE TOULON   (France)

^b AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

Catalysis; Cerium; Copper; Oxides; Thin film structures; Transmission electron microscopy; X ray photoelectron spectroscopy

Indexed keywords

CERIUM; COPPER OXIDES; SILICON COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CATALYTIC PERFORMANCES; DEPTH PROFILES; THIN FILM STRUCTURES;

THIN FILMS;

EID: 41049088671     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.12.041     Document Type: Article

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