Second-harmonic efficiency of ZnO nanolayers

Applied Physics Letters

Volumn 84, Issue 2, 2004, Pages 170-172

  Neumann, Uwe ^a   Grunwald, Ruediger ^a   Griebner, Uwe ^a   Steinmeyer, Günter ^a   Seeber, Wolfgang ^b  

^a MAX BORN INSTITUT   (Germany)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRON MICROSCOPY; ELLIPSOMETRY; FILM PREPARATION; GRAIN SIZE AND SHAPE; OPTICAL VARIABLES MEASUREMENT; PYROLYSIS; SECOND HARMONIC GENERATION; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

CONVERSION EFFICIENCES; FRESNEL EQUATION; OPTICAL SPECTROSCOPY; POLARIZATION DEPENDENT TRANSMISSION COEFFICIENTS; SPRAY PYROLYSIS; STRUCTURAL PROPERTIES;

NANOSTRUCTURED MATERIALS;

EID: 0842333249     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1639939     Document Type: Article

References (16)

1. G. Steinmeyer, D. H. Sutter, L. Gallmann, N. Matuschek, and U. Keller, Science 286, 1507 (1999).
2. G. G. Paulus, F. Grasbon, H. Walther, P. Villoresi, M. Nisoli, S. Stagira, E. Priori, and S. De Silvestri, Nature (London) 414, 182 (2001).
3. A. Baltuška, T. Udem, M. Uiberacker, M. Hentschel, E. Goulielmakis, C. Gohle, R. Holzwarth, V. S. Yakoviev, A. Scrinzi, T. W. Haensch, and F. Krausz, Nature (London) 421, 6923 (2003).
4. O. D. Muecke, T. Tritschler, M. Wegener, U. Morgner, and F. X. Kaertner, Opt. Lett. 27, 2127 (2002).
5. M. Kakehata, Y. Fujihira, H. Takada, Y. Kobayashi, K. Torizuka, T. Homma, and H. Takahashi, Appl. Phys. B: Lasers Opt. 74, S43 (2002).
6. M. O. Abou-Helal and W. T. Seeber, J. Non-Cryst. Solids 218, 139 (1997).
7. U. Griebner, R. A. Kaindl, T. Elsaesser, and W. Seeber, Appl. Phys. B: Lasers Opt. 67, 757 (1998).
8. L. Kulyuk, I. Kravetsky, A. Micu, E. Koryaev, V. Moshnyaga, I. Horoshun, I. Muscutariu, and V. Socoliuc, Proc. SPIE 2801, 135 (1996).
9. H. Cao, J. Y. Wu, H. C. Ong, J. Y. Dai, and R. P. H. Chang, Appl. Phys. Lett. 73, 572 (1998).
10. Gang Wang, G. T. Kiehne, G. K. L. Wong, J. B. Ketterson, X. Liu, and R. P. H. Chang, Appl. Phys. Lett. 80, 401 (2002).
11. W. T. Seeber, M. O. Abou-Helal, S. Barth, D. Beil, T. Hoeche, H. H. Afify, and S. E. Demian, Mater. Sci. Semicond. Process. 2, 45 (1999).
12. R. A. Haefer, Oberflaechen- und Duennschicht-Technologie, Teil I: Beschichtungen von Oberflaechen (Springer, Berlin, 1987).
13. Y. R. Shen, The Principles of Nonlinear Optics (Wiley, New York, 1984).
14. C. W. Teng, J. F. Muth, Ue. Oezguer, M. J. Bergmann, H. O. Everitt, A. K. Sharma, C. Jin, and J. Narayan, Appl. Phys. Lett. 76, 979 (2000).
15. D. K. Nikogosyan, Properties of Optical and Laser-Related Materials (Wiley, Chichester, 1997).
16. R. C. Miller, D. A. Kleinman, and A. Savage, Phys. Rev. Lett. 11, 146 (1963).