XPS studies on ZrO2 thin films deposited on glass substrate by sol-gel

Key Engineering Materials

Volumn 368-372 PART 2, Issue , 2008, Pages 1277-1279

  Yu, Xingang ^a   Gong, Yi ^a   Bi, Wenyue ^a   Tian, Xuechun ^a   Ma, Hongwen ^b   Zhao, Huifeng ^c   Qiu, Guohong ^d   Wang, Li ^c  

^a CHONGQING UNIVERSITY   (China)

^b CHINA UNIVERSITY OF GEOSCIENCES   (China)

^c CHINA BUILDING MATERIALS ACADEMY   (China)

^d NONE

Author keywords

Sol gel; XPS; ZrO2 CeO2 thin films

Indexed keywords

DEPOSITION; DIFFUSION; GLASS; SOL-GEL PROCESS; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIA;

CHEMICAL COMPOSITION; NEGATIVE DIFFUSION; STABLE STATES; VALENCE STATE;

THIN FILMS;

EID: 40949164706     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-473-1.1277     Document Type: Conference Paper

References (4)

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