XPS studies on composite TiO2-SiO2 thin films deposited on metal substrate by sol-gel

Materials Science Forum

Volumn 475-479, Issue II, 2005, Pages 1647-1650

  Yu, Xingang ^a   Ma, Hongwen ^b   Long, Fei ^a   Zhao, Hui Feng ^c   Bi, Wen Rue ^c   Luo, Wu Wen ^c   Wang, Li ^c   Liu, Nanyun ^a  

^a GUANGXI UNIVERSITY   (China)

^b CHINA UNIVERSITY OF GEOSCIENCES   (China)

^c CHINA BUILDING MATERIALS ACADEMY   (China)

Author keywords

Sol gel; TiO2 SiO2 Thin Films; XPS

Indexed keywords

COMPOSITE MATERIALS; CURRENT DENSITY; DATA ACQUISITION; SOL-GELS; SPUTTERING; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

BONDING ENERGY VALUE; RESIDUAL CARBON; SURFACE CHEMICAL COMPOSITION; TIO2-SIO2;

THIN FILMS;

EID: 17044363956     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-960-1.1647     Document Type: Conference Paper

References (5)

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4. Yu Xingang, PH.D Thesis, China University of Geosciences Beijing, 1997.
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