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Volumn 961, Issue , 2006, Pages 20-25

Directed self-assembly of thin block copolymer films under controlled atmosphere

Author keywords

[No Author keywords available]

Indexed keywords

BLOCK COPOLYMERS; POLYSTYRENES; SELF ASSEMBLY; THIN FILMS;

EID: 40949119908     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0961-o17-03     Document Type: Conference Paper
Times cited : (1)

References (10)
  • 2
    • 40949085915 scopus 로고    scopus 로고
    • K.W. Guarini, C. T. Black, Y. Zhang, I. V. Babich, E. M. Sikorski, L. M. Gignac, IEEE Int. Electron Devices Meeting 22.2.1. (2003).
    • K.W. Guarini, C. T. Black, Y. Zhang, I. V. Babich, E. M. Sikorski, L. M. Gignac, IEEE Int. Electron Devices Meeting 22.2.1. (2003).
  • 8
    • 40949164951 scopus 로고    scopus 로고
    • Certain equipment, instruments or materials are identified in this paper in order to adequately specify the experimental details. Such identification does not imply recommendation by the National Institute of Standards and Technology nor does it imply the materials are necessarily the best available for the purpose. Official contribution of the National Institute of Standards and Technology; not subject to copyright in the United States
    • Certain equipment, instruments or materials are identified in this paper in order to adequately specify the experimental details. Such identification does not imply recommendation by the National Institute of Standards and Technology nor does it imply the materials are necessarily the best available for the purpose. Official contribution of the National Institute of Standards and Technology; not subject to copyright in the United States
  • 10
    • 40949135537 scopus 로고    scopus 로고
    • The data throughout the manuscript and in the figures and table are presented along with the standard uncertainty (±) involved in the measurement based on one standard deviation.
    • The data throughout the manuscript and in the figures and table are presented along with the standard uncertainty (±) involved in the measurement based on one standard deviation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.