Evaluation of elastic properties of nanoporous silicon oxide thin films by picosecond laser ultrasonics

European Physical Journal: Special Topics

Volumn 153, Issue 1, 2008, Pages 211-213

  Mechri, C ^a   Ruello, P ^a   Gusev, V ^a   Breteau, J M ^a   Mounier, D ^a   Henderson, M ^a   Gibaud, A ^a   Dourdain, S ^a  

^a UNIVERSITÉ DU MAINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 40949093198     PISSN: 19516355     EISSN: 19516401     Source Type: Journal    
DOI: 10.1140/epjst/e2008-00430-8     Document Type: Conference Paper

References (3)

1. C. Thomsen, H.T. Grahn, H.J. Maris, J. Tauc, Phys. Rev. B 34, 4129 (1986)
2. S. Dourdain, A. Gibaud, Appl. Phys. Lett. 87, 223105 (2005)
3. S. Dourdain, J.-F. Bardeau, M. Colas, B. Smarsly, A. Mehdi, B.M. Ocko, A. Gibaud, Appl. Phys. Lett. 86, 113108 (2005)