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Volumn 4, Issue SUPPL.1, 2007, Pages

Thermal characterization of hard decorative thin films

Author keywords

(TiSi)M; Coatings; DC magnetron sputtering; Deposition conditions; Modulated IR radiometry; Oxygen flow; Surface roughness; Thermal properties; Thin films; TiCxOy

Indexed keywords

(TISI)M; DC MAGNETRON SPUTTERING; DEPOSITION CONDITIONS; MODULATED IR RADIOMETRY; OXYGEN FLOW; THERMAL PROPERTIES; TICXOY;

EID: 40949092559     PISSN: 16128850     EISSN: 16128869     Source Type: Journal    
DOI: 10.1002/ppap.200730609     Document Type: Conference Paper
Times cited : (6)

References (6)
  • 1
    • 70349412702 scopus 로고    scopus 로고
    • F. Macedo, J. Ferreira, F. Vaz, L. Rebouta, A. Haj Daoud, D. Dietzel, B. K. Bein, Photothermal Characterization of Sputtered Thin Films and Substrate Treatment, in: Photoacoustic & Photothermal Phenomena, F. ScudieriM. Bertolotti, Eds., AIP Conference Proceedings 1999, 463, 536.
    • F. Macedo, J. Ferreira, F. Vaz, L. Rebouta, A. Haj Daoud, D. Dietzel, B. K. Bein, "Photothermal Characterization of Sputtered Thin Films and Substrate Treatment", in: Photoacoustic & Photothermal Phenomena, F. ScudieriM. Bertolotti, Eds., AIP Conference Proceedings 1999, 463, 536.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.