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Volumn 975, Issue , 2008, Pages 139-146
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Synthetic focusing for high resolution guided wave pipe inspection: Further results and robustness studies
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Author keywords
Defect Sizing; Imaging; Pipe Inspection
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Indexed keywords
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EID: 40849147393
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.2902599 Document Type: Conference Paper |
Times cited : (8)
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References (6)
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