The application of synthetically focused imaging techniques for high resolution guided wave pipe inspection

AIP Conference Proceedings

Volumn 894, Issue , 2007, Pages 681-688

  Davies, J ^a   Cawley, P ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Defect sizing; Imaging; Pipe inspection

Indexed keywords

EID: 34248213546     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2718036     Document Type: Conference Paper

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