|
Volumn 178, Issue 8, 2008, Pages 591-595
|
Computer program TRACK_VISION for simulating optical appearance of etched tracks in CR-39 nuclear track detectors
|
Author keywords
CR 39; Experimental analysis; Optical properties; Optics; Particle detection; Solid state nuclear track detector
|
Indexed keywords
AUTOMATIC PROGRAMMING;
ELECTROCHEMICAL ETCHING;
NUCLEAR ENERGY;
OBJECT ORIENTED PROGRAMMING;
OPTICAL MICROSCOPY;
OPTICAL PROPERTIES;
EXPERIMENTAL ANALYSIS;
PARTICLE DETECTION;
SOLID STATE NUCLEAR TRACK DETECTORS;
PARTICLE DETECTORS;
|
EID: 40849130237
PISSN: 00104655
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cpc.2007.11.011 Document Type: Article |
Times cited : (40)
|
References (15)
|