Measuring depths of sub-micron tracks in a CR-39 detector from replicas using Atomic Force Microscopy

Radiation Measurements

Volumn 40, Issue 2-6, 2005, Pages 380-383

  Yu, K N ^a   Ng, F M F ^a   Nikezic, D ^a,b  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^b UNIVERSITY OF KRAGUJEVAC   (Serbia)

Author keywords

Atomic force microscopy; CR 39; Replica; Track length

Indexed keywords

ETCHING; FLUIDS; SOLUTIONS; ULTRASONICS;

ETCHING PERIODS; SOLID-STATE NUCLEAR TRACK DETECTORS; TRACK LENGTHS;

ATOMIC FORCE MICROSCOPY;

EID: 27744477406     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radmeas.2005.03.011     Document Type: Conference Paper

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