Near-field scanning optical microscopy studies of thin film surfaces and interfaces

Applied Surface Science

Volumn 254, Issue 12, 2008, Pages 3681-3684

  Klapetek, Petr ^a   Buršík, Jiří ^b  

^a CZECH METROLOGY INSTITUTE   (Czech Republic)

^b INSTITUTE OF PHYSICS OF MATERIALS   (Czech Republic)

Author keywords

FDTD; Image artifacts; NSOM

Indexed keywords

FINITE DIFFERENCE TIME DOMAIN METHOD; INTERFACES (MATERIALS); MATHEMATICAL MODELS; OPTICAL MICROSCOPY; SURFACE PROPERTIES;

IMAGE ARTIFACTS; SCANNING OPTICAL MICROSCOPY MEASUREMENTS;

THIN FILMS;

EID: 40849092737     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.10.092     Document Type: Article

References (7)

1. Paesler M.A., and Moyer P.J. Near-Field Optics, Theory, Instrumentation and Applications (1996), John Wiley & Sons
2. Hecht B., Sick B., Wild U.P., Deckert V., Zenobi R., Martin O.J., and Pohl D.W. J. Chem. Phys. 112 (2000)
3. Kann J.L., Milster T.D., Froehlich F.F., Ziolkowski R.W., and Judkins J.B. J. Opt. Soc. Am. A 12 (1995)
4. Hecht B., Bielefeldt H., Inouye Y., and Pohl D.W. J. Appl. Phys. 81 (1997)
5. Weston K.D., DeAro J.A., and Buratto S.K. Rev. Sci. Instrum. 67 (1996)
6. Taflove A., and Hagness S.C. Computational Electrodynamics: The Finite-Difference Time-Domain Method. second ed. (2000), Artech House, Norwood, MA
7. Ramahi O.M. IEEE Trans. Anten. Propagat. 45 (1997) 1263-1271