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Volumn 516, Issue 12, 2008, Pages 3747-3754
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Ce1-xNdxO2-δ/Si thin films obtained by pulsed laser deposition: Microstructure and conduction properties
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Author keywords
Cerium dioxide thin films; Electron microscopy; Impedance spectroscopy; Pulsed laser deposition; Solid solutions; Space charge model
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Indexed keywords
CERIUM COMPOUNDS;
ELECTRIC SPACE CHARGE;
ELECTRON MICROSCOPY;
MATHEMATICAL MODELS;
PULSED LASER DEPOSITION;
CERIUM DIOXIDE THIN FILMS;
IMPEDANCE SPECTROSCOPY;
SPACE CHARGE MODEL;
THIN FILMS;
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EID: 40749138937
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2007.06.224 Document Type: Article |
Times cited : (8)
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References (29)
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