Improvement of emission reliability of carbon nanotube emitters by electrical conditioning

Thin Solid Films

Volumn 516, Issue 11, 2008, Pages 3618-3621

  Park, J H ^a   Jeon, S Y ^a   Alegaonkar, P S ^a   Yoo, J B ^a  

^a Sungkyunkwan University   (South Korea)

Author keywords

Carbon nanotube; Electrical aging; Field emission; Reliability

Indexed keywords

FIELD EMISSION; LIGHT EMISSION; RELIABILITY ANALYSIS; VOLTAGE CONTROL;

ELECTRICAL AGING; FIELD EMISSION MEASUREMENTS;

CARBON NANOTUBES;

EID: 40649085597     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.08.115     Document Type: Article

References (16)

1. Baughman R.H., Zakhidov A.A., and de Heer W.A. Science 297 (2002) 787
2. Teo K.B.K., Minoux E., Hudanski L., Peauger F., Schnell J.P., Gangloff L., Legagneux P., Dieumegard D., Amaratunga G.A.J., and Milne W.I. Nature 437 (2005) 968
3. Yue G.Z., Qiu Q., Gao B., Cheng Y., Zhang J., Shimoda H., Chang S., Lu J.P., and Zhou O. Appl. Phys. Lett. 81 (2002) 355
4. Choi W.B., Chung D.S., Kang J.H., Kim H.Y., Jin Y.W., Han I.T., Lee Y.H., Jung J.E., Lee N.S., Park G.S., and Kim J.M. Appl. Phys. Lett. 75 (1999) 3129
5. Kim H.J., Choi J.J., Han J.H., Park J.H., and Yoo J.B. IEEE Trans. Electron Devices 53/11 (2006) 2674
6. Dean K.A., and Chalamala B.R. Appl. Phys. Lett. 75 (1999) 3017
7. Ho G.W., Wee A.T.S., and Lin J. Appl. Phys. Lett. 79 (2001) 260
8. Bornard J.M., and Klinke C. Phys. Rev., B 67 (2003) 115406
9. Wang Z.L., Gao R.P., de Heer W.A., and Poncharl P. Appl. Phys. Lett. 80 (2002) 856
10. Fujieda T., Hidaka K., Hayashibara M., Kamino T., Matsumoto H., Ose Y., Abe H., Shimizu T., and Tokumoto H. Appl. Phys. Lett. 85 (2004) 5739
11. Saito Y., Seko K., and Kinoshita J. Diamond Relat. Mater. 14 (2005) 1843
12. Yi W.K., Jeong T.W., Yu S.G., Heo J.N., Lee C.S., Kim W.S., Yoo J.B., and Kim J.M. Adv. Mater. 14 (2002) 1464
13. Kim W.S., Lee J.H., Jeong T.W., Heo J.N., Kong B.Y., Jin Y.W., Kim J.M., Cho S.H., Park J.H., and Choe D.H. Appl. Phys. Lett. 87 (2005) 163112
14. Vink T.J., Cillies M., Kriege J.C., and van de Laar H.W.J.J. Appl. Phys. Lett. 83 (2003) 3552
15. Fowler R.H., and Nordheim L.W. Proc. R. Soc. Lond., Ser. A 119 (1928) 173
16. Sveningsson M., Hansen K., Svensson K., Olsson E., and Campbell B. Phys. Rev., B 72 (2005) 085429