ZnO tetrapods designed as multiterminal sensors to distinguish false responses and increase sensitivity

Nano Letters

Volumn 8, Issue 2, 2008, Pages 652-655

  Zhang, Zengxing ^a   Sun, Lianfeng ^b   Zhao, Yuanchun ^b   Liu, Zheng ^b   Liu, Dongfang ^a   Cao, Li ^a   Zou, Binsuo ^a   Zhou, Weiya ^a   Gu, Changzhi ^a   Xie, Sishen ^a  

^a INSTITUTE OF PHYSICS   (China)

^b NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

MULTITERMINAL SENSORS; NANODEVICES; ULTRAVIOLET LIGHT;

ELECTRON BEAM LITHOGRAPHY; OPTICAL SENSORS; OPTOELECTRONIC DEVICES; PHASE NOISE; ULTRAVIOLET RADIATION; WAVELENGTH;

ZINC OXIDE;

NANOMATERIAL; ZINC OXIDE;

ARTICLE; CHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY; OPTICS; RADIATION EXPOSURE; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TRANSDUCER;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIGHT; MICROELECTRODES; NANOSTRUCTURES; NANOTECHNOLOGY; OPTICS; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TRANSDUCERS; ZINC OXIDE;

EID: 40449136427     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl073088o     Document Type: Article

References (19)

1. Li, Y.; Qian, F.; Lieber, C. M. Mater. Today 2006, 9 (10), 19.
2. Alivisatos, P. Nat. Biotechnol. 2002, 13, 40.
3. Niemeyer, C. M. Angew. Chem., Int. Ed. 2001, 40, 4128.
4. McFarland, A. D.; Van Duyne, R. P. Nano Lett. 2003, 3, 1057.
5. Patolsky, F.; Lieber, C. M. Mater. Today 2005, 8 (4), 20.
6. Cui, Y.; Wei, Q. Q.; Park, H. K.; Lieber, C. M. Science 2001, 293, 1289.
7. Someya, T.; Small, J.; Kim, P; Nuckolls, C.; Yardley, J. Y. Nano Lett. 2003, 3, 877.
8. Zhang, D. H.; Liu, Z. Q.; Li, C.; Tang, T.; Liu, X. L.; Han, S.; Lei, B.; Zhou, C. W. Nano Lett. 2004, 4, 1919.
9. Sysoev, V. V.; Button, B. K.; Wepsiec, K.; Dmitriev, S.; Kolmakov, A. Nano Lett. 2006, 6, 1584.
10. Kuang, Q.; Lao, C. S.; Wang, Z. L.; Xie, Z. X.; Zhang, L. S. J. Am. Chem. Soc. 2007, 129, 6070.
11. Li, Z.; Chen, Y.; Li, X.; Kamins, T. I.; Nauka, K.; Williams, R. S. Nano Lett. 2004, 4, 245.
12. Zhang, Z. X.; Yuan, H. J.; Gao, Y.; Wang, J. X.; Liu, D. F.; Shen, J.; Liu, L. F.; Zhou, W. Y.; Xie, S. S.; Wang, X.; Zhu, X.; Zhao, Y. C.; Sun, L. F. Appl. Phys. Lett. 2007, 90, 153116.
13. Zhang, Z. X.; Liu, Y. Z.; Liu, D. F.; Luo, S. D.; Shen, J.; Liu, L. F.; Ma, W. J.; Ren, Y.; Xiang, Y. J.; Zhou, W. Y.; Xie, S. S.; Zheng, K. H.; Zhao, Y. C.; Sun, L. F.; Zou, C. X.; Yu, D. P. Appl. Phys. Lett. 2007, 91, 013106.
14. Ding, Y.; Wang, Z. L.; Sun, T. J.; Qiu, J. S. Appl. Phys. Lett. 2007, 90, 153510.
15. Yan, H. Q.; He, R. R.; Pham, J.; Yang, P. D. AdV. Mater. 2003, 15, 402.
16. Manna, L.; Milliron, D. J.; Meisel, A.; Scher, E. C.; Alivisatos, A. P. Nat. Mater. 2003, 2, 382.
17. Liu, Y.; Gorla, C. R.; Liang, S.; Emanetoglu, N.; Lu, Y.; Shen, H.; Wraback, M. J. Electron. Mater. 2000, 29, 69.
18. Zhang, D. H.; Brodie, D. E. Thin Solid Films 1995, 261, 334.
19. Zhang, D. H. J. Phys. D: Appl. Phys. 1995, 28, 1273.