Determination of diffusion coefficients in Au/Ni thin films by Auger electron spectroscopy

Physica Status Solidi (A) Applied Research

Volumn 201, Issue 9, 2004, Pages 2063-2066

  Abdul Lettif, Ahmed M ^a  

^a UNIVERSITY OF BABYLON   (Iraq)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AUGER ELECTRON SPECTROSCOPY; DIFFUSION; GOLD; INTERDIFFUSION (SOLIDS); MATHEMATICAL MODELS; METALLIZING; MULTILAYERS; NICKEL; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

DIFFUSION ACTIVATION ENERGY; ELECTRON MICROPROBES; METALLIZATION SYSTEMS; WIPPLE MODEL;

THIN FILMS;

EID: 4043171337     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200306814     Document Type: Article

References (17)

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