SCOPUS 정보 검색 플랫폼

Journal of Materials Science

Volumn 36, Issue 17, 2001, Pages 4189-4194

Scanning AES and XPS analysis of a thin Au emissivity barrier on Ni alloy

(4) Cherian, J T a Fisher, R M b Castner, D G b Dellwo, R R c

a Northwest Surface Laboratory (United States)

b University of Washington (United States)

c RBD Enterprises Inc (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPOSITION; DIFFUSION IN SOLIDS; ELECTROPLATING; GOLD; HEAT RADIATION; HIGH TEMPERATURE APPLICATIONS; JET ENGINES; THERMAL INSULATING MATERIALS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

GOLD EMISSIVITY BARRIER; GOLD PLATED INCONEL; GOLD PLATED NICKEL ALLOY; LOW EMISSIVITY COATING; SCANNING AUGER MICROGRAPHS;

NICKEL ALLOYS;

EID: 0035445509 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/A:1017973006974 Document Type: Article

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.