Low-temperature study of nonlinear transport across oxide grain boundaries

Applied Physics Letters

Volumn 85, Issue 4, 2004, Pages 561-563

  Shao, Rui ^a   Vavro, Juro ^a   Bonnell, Dawn A ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK RESISTIVITY; DOUBLE SCHOTTKEY BARRIER (DSB); NONLINEAR TRANSPORT; TUNNELING MODEL;

CARRIER CONCENTRATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; GRAIN BOUNDARIES; HALL EFFECT; SCHOTTKY BARRIER DIODES; SINGLE CRYSTALS; THERMIONIC EMISSION; TRANSMISSION ELECTRON MICROSCOPY;

STRONTIUM COMPOUNDS;

EID: 4043156212     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1776329     Document Type: Article

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