INL reconstruction of A/D converters via parametric spectral estimation

IEEE Transactions on Instrumentation and Measurement

Volumn 53, Issue 4, 2004, Pages 940-946

  Attivissimo, Filippo ^a   Giaquinto, Nicola ^a   Kale, Izzet ^b  

^a POLITECNICO DI BARI   (Italy)

^b UNIVERSITY OF WESTMINSTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; DISCRETE FOURIER TRANSFORMS; MEASUREMENT THEORY; PARAMETER ESTIMATION; POLYNOMIALS; SPECTRUM ANALYSIS;

CHEBYSHEV FUNCTIONS; HISTOGRAM TEST; INTEGRAL NONLINEARITY; PARAMETRIC SPECTRAL ESTIMATION;

ELECTRIC VARIABLES MEASUREMENT;

EID: 4043072674     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.831508     Document Type: Article

References (14)

1. IEEE Standard 1057/94 for Digitizing Waveform Recorders, Dec. 1994.
2. IEEE Standard 1241-2000 for Terminology and Test Methods for Analog-to-Digital Converters, Dec. 2000.
3. P. Carbone and G. Chiorboli, "ADC sinewave histogram testing with quasicoherent sampling," IEEE Trans. Instrum. Measure., vol. 50, pp. 949-953, Aug. 2001.
4. F. Adamo, F. Attivissimo, and N. Giaquinto, "FFT test of A/D converters to determine the integral nonlinearity," IEEE Trans. Instrum. Measure., vol. 51, pp. 1050-1054, Oct. 2002.
5. F. Adamo, F. Attivissimo, N. Giaquinto, and M. Savino, "Measuring the static characteristic of dithered A/D converters," Measurement, pp. 231-239, Nov. 2002.
6. F. Adamo, F. Attivissimo, N. Giaquinto, and A. Trotta, "A/D converters nonlinearity measurement and correction by frequency analysis and dither," in Proc. IMTC/02, Anchorage, AK, May 2002, pp. 201-206.
7. J. Holub and O. Aumala, "Large scale error reduction in dithered ADC," in Proc. IWADC 2000, Vienna, Austria, Sept. 2000, pp. 42-48.
8. J. P. Boyd, Chebyshev and Fourier Spectral Methods, 2nd ed. New York: Dover, 2001. rev..
9. P. Carbone, E. Nunzi, and D. Petri, "Windows for ADC dynamic testing via frequency-domain analysis," IEEE Trans. Instrum. Measure., vol. 50, pp. 1571-1576, Dec. 2001.
10. G. Andria, M. Savino, and A. Trotta, "Windows and interpolation algorithms to improve electrical measurement accuracy," IEEE Trans. Instrum. Measure., vol. 38, pp. 856-863, Apr. 1989.
11. J. Schoukens, R. Pintelon, and H. Van Hamme, "The interpolated fast fourier transform: A comparative study," IEEE Trans. Instrum. Measur., vol. 41, pp. 226-232, Apr. 1992.
12. R. Pintelon and J. Schoukens, "An improved sine-wave fitting procedure for characterizing data acquisition channels," IEEE Trans. Instrum. Measure., vol. 45, pp. 588-593, Apr. 1996.
13. K. W. Hejn and R. C. S. Morling, "A semifixed frequency method for evaluating the effective resolution of A/D converters," IEEE Trans. Instrum. Measure., vol. 41, pp. 212-217, Apr. 1992.
14. N. Giaquinto and A. Trotta, "Fast and accurate ADC testing via an enhanced sine wave fitting algorithm," IEEE Trans. Instrum. Measure., vol. 46, pp. 1020-1025, Aug. 1997.