Evidence for a new dissipationless effect in 2D electronic transport

Physical Review Letters

Volumn 90, Issue 4, 2003, Pages 468071-468074

  Zudov, M A ^a   Du, R R ^a   Pfeiffer, L N ^b   West, K W ^b  

^a UNIVERSITY OF UTAH   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ELECTRON CYCLOTRON RESONANCE; GROUND STATE; HALL EFFECT; MAGNETIC FIELD EFFECTS;

HALL RESISTANCE;

ELECTRON TRANSPORT PROPERTIES;

EID: 4043072369     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)

1. Perspectives in Quantum Hall Effect-Novel Quantum Liquids in Low-Dimensional Semiconductor Structures, edited by S. Das Sarma and A. Pinczuk (Wiley and Sons, New York, 1997).
2. H. Fröhlich, Proc. R. Soc. London A 233, 296 (1954).
3. L. V. Keldysh, in Bose-Einstein Condensation, edited by A. Griffin, D. W. Snoke, and S. Stringari (Cambridge, New York, 1995).
4. Yu. E. Lozovik and V. I. Yudson, Pis'ma Zh. Eksp. Teor. Fiz. 22, 556 (1975) [JETP Lett. 22, 274 (1975)].
5. See, e.g., T. Fukuzawa, E. E. Mendez, and J. M. Hong, Phys. Rev. Lett. 64, 3066 (1990); U. Sivan, P. M. Solomon, and H. Shtrikman, ibid. 68, 1196 (1992).
6. See, e.g., T. Fukuzawa, E. E. Mendez, and J. M. Hong, Phys. Rev. Lett. 64, 3066 (1990); U. Sivan, P. M. Solomon, and H. Shtrikman, ibid. 68, 1196 (1992).
7. See, e.g., I. B. Spielman, J. P. Eisenstein, L. N. Pfeiffer, and K. W. West, Phys. Rev. Lett 84, 5808 (2000); 87, 036803 (2001).
8. See, e.g., I. B. Spielman, J. P. Eisenstein, L. N. Pfeiffer, and K. W. West, Phys. Rev. Lett 84, 5808 (2000); 87, 036803 (2001).
9. M. Dobers, K. v. Klitzing, and G. Weimann, Phys. Rev. B 38, 5453 (1988).
10. E. Vasiliadou, G. Muller, D. Heitmann, D. Weiss, K. v. Klitzing, H. Nickel, W. Schlapp, and R. Losch, Phys. Rev. B 48, 17145 (1993).
11. M. A. Zudov, R. R. Du, J. A. Simmons, and J. L. Reno, Phys. Rev. B 64, 201311(R) (2001).
12. M. A. Zudov, R. R. Du, J. A. Simmons, and J. L. Reno, cond-mat/9711149; M. A. Zudov, Ph.D. thesis, University of Utah, 1999.
13. P. D. Ye, L. W. Engel, D. C. Tsui, J. A. Simmons, J. R. Wendt, G. A. Vawter, and J. L. Reno, Appl. Phys. Lett 79, 2193 (2001).
14. 0.75As heterostructure wafers, and from both the square and Hall-bar geometries.
15. The total insertion loss of our waveguide was measured to be ∼8 dB for f between 40 and 60 GHz.
16. See, e.g., P. T. Coleridge, R. Stoner, and R. Fletcher, Phys. Rev. B 39, 1120 (1989); P. T. Coleridge, ibid. 44, 3793 (1991).
17. See, e.g., P. T. Coleridge, R. Stoner, and R. Fletcher, Phys. Rev. B 39, 1120 (1989); P. T. Coleridge, ibid. 44, 3793 (1991).
18. C. Kallin and B. I. Halperin, Phys. Rev. B 31, 3635 (1985).
19. I. L. Aleiner and L. I. Glazman, Phys. Rev. B 52, 11296 (1995).