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Volumn 40, Issue 16, 2004, Pages 1026-1027
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IMPATT oscillation in SiC p+-n- -n+ diodes with a guard ring formed by vanadium ion implantation
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTIVITY;
ELECTRIC FIELDS;
ELECTRONICS PACKAGING;
ION IMPLANTATION;
MICROWAVES;
OSCILLATIONS;
SILICON CARBIDE;
THERMAL CONDUCTIVITY OF SOLIDS;
ELECTRICAL ISOLATION;
GUARD RINGS;
IMPACT AVALANCHE;
OUTPUT POWER;
SEMICONDUCTOR DIODES;
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EID: 4043067957
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20045312 Document Type: Article |
Times cited : (16)
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References (3)
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