Powder diffraction: Least-squares and beyond

Journal of Research of the National Institute of Standards and Technology

Volumn 109, Issue 1, 2004, Pages 107-123

  David, W I F ^a  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Least squares analysis; Powder diffraction; Rietveld analysis

Indexed keywords

ALGORITHMS; DATA ACQUISITION; DATA REDUCTION; ERROR ANALYSIS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; OPTIMIZATION; PARAMETER ESTIMATION; STATISTICAL METHODS;

GAUSSIAN DISTRIBUTIONS; LEAST SQUARES ANALYSIS; POWDER DIFFRACTION; RIETVELD ANALYSIS; STANDARD DEVIATION;

X RAY POWDER DIFFRACTION;

EID: 4043062794     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.109.008     Document Type: Conference Paper

References (13)

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11. D. S. Sivia, Dealing with Duff Data, in Proceedings of the Maximum Entropy Conference, M. Sears, V. Nedeljkovic, N. E. Pendock & S. Sibisi, eds., Port Elizabeth, South Africa: NMB printers (1996) pp. 131-137.
12. G. E. P. Box and C. G. Tiao, Biometrika 55, 119-129 (1968).
13. W. I. F. David and D. S. Sivia, J. Appl. Cryst. 34, 318-324 (2001).