Microstructure characterization of titanium-base aluminium alloys by X-ray diffraction using Warren-Averbach and Rietveld method

Journal of Alloys and Compounds

Volumn 453, Issue 1-2, 2008, Pages 131-137

  Ghosh, J ^a   Chattopadhayay, S K ^a   Meikap, A K ^a   Chatterjee, S K ^a  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Metals and alloys; Microstructure; Rietveld method; Warren Averbach; X ray diffraction

Indexed keywords

DISLOCATIONS (CRYSTALS); FOURIER ANALYSIS; MICROSTRUCTURE; RIETVELD ANALYSIS; STACKING FAULTS; X RAY DIFFRACTION;

DEFORMATION GROWTH FAULTS; DISLOCATION DENSITY; HEXAGONAL SYSTEMS; MICROSTRAINS;

ALUMINUM ALLOYS;

EID: 40149090618     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.11.125     Document Type: Article

References (39)

1. Mukherjee P., Sarkar A., et al. Metall. Mater. Trans. A 36 (2005) 2351
2. Lakshmi S.G., Arivuoli D., and Ganguli B. Mater. Chem. Phys. 76 2 (2002) 187
3. Diplas S., Tsakiropoulos P., et al. Acta Mater. 8 (2002) 1951
4. Karmakar G., Mukherjee P., et al. Bull. Mater. Sci. 24 (2001) 649
5. Recina V., and Karlsson B. Mater. Sci. Technol. 15 1 (1999) 57
6. Zhang X.D., Wiezorek J.M.K., et al. Phil. Mag. Lett. 79 8 (1999) 519
7. Sen R., Chattopadhyay S.K., and Chatterjee S.K. Metall. Mater. Trans. 29 (1998) 2639
8. Warren B.E., and Averbach B.L. J. Appl. Phys. 21 (1950) 595
9. Rietveld H.M. J. Appl. Cryst. 2 (1969) 65
10. Warren B.E. X-ray Diffraction (1969), Addison-Wesley, Reading, MA 251
11. McKeehan M., and Warren B.E. J. Appl. Phys. 24 1 (1953) 52
12. Aqua E.N., and Wagner C.N.J. Phil. Mag. 9 (1964) 565
13. Chatterjee S.K., and Sen Gupta S.P. J. Mater. Sci. 9 (1974) 953
14. Chatterjee S.K., and Sen Gupta S.P. J. Mater. Sci. 10 (1975) 1093
15. Crist B., and Cohen J.B. J. Polym. Sci. 17 (1979) 1001
16. Louer D., Vargas R., and Auffredic J.P. J. Am. Ceram. Soc. 67 2 (1984) 136
17. Mukherjee P., Barat P., et al. J. Nucl. Mater. 305 (2002) 169
18. Ghosh J., Chattopadhyay S.K., Chatterjee S.K., et al. Jpn. J. Appl. Phys. 44 9A (2005) 6678
19. Sahu P. J. Appl. Cryst. 38 (2005) 112
20. Sahu P. Intermetallics 14 (2006) 180
21. Lutterotti L., and Scardi P. J. Appl. Crystallogr. 23 (1990) 246
22. J.G.M. Van Berkum, Ph.D. Thesis, Delft University of Technology, The Netherlands, 1994.
23. Van Berkum, et al. Powder Diffrac. 10 (1995) 129
24. Stokes A.R. Proc. Phys. Soc. Lond. 61 (1948) 382
25. Wagner C.N.J. Proceedings of the Symposium AIME. Gordon and Breach, New York (1956)
26. Chatterjee S.K. X-ray Diffraction. Its Theory and Applications (1999), Prentice Hall of India, New Delhi
27. Van Berkum J.G.M., Vermeulen A.C., et al. J. Appl. Cryst. 27 (1994) 345
28. Cullity B.D. Elements of X-ray Diffraction (1978), Addison-Wesley Publishing Co., Reading, MA p. 363
29. Enzo S., Fagherazzi G., Benedth A., and Polizzi S. J. Appl. Crystallogr. 21 (1988) 536
30. Balzar D., and Ledbetter H. J. Appl. Crystallogr. 26 (1993) 97
31. L. Lutterotti, P. Scardi, developed two programs: General Peak Separation Routine-MARQFIT (1990) and Line Broadening Analysis by W.A.X.S (1992).
32. Nandi R.K., Kuo H.K., Shosberg W., Wissler G., Cohen J.B., and Crist Jr. B. J. Appl. Cryst. 17 (1984) 22
33. Young R.A., and Wiles D.B. J. Appl. Cryst. 15 (1982) 430
34. Caglioti G., Paoletti A., and Ricci F.P. Nucl. Instrum. Meth. 35 (1958) 223
35. Chattopadhyay S.K., Chatterjee S.K., and Sen Gupta S.P. J. Mater. Res. 5 (1990) 2120
36. Dieter G.E. Mechanical Metallurgy (1987), McGraw-Hill Book Co., New York p. 136
37. Sen R., Chattopadhyay S.K., and Chatterjee S.K. Jpn. J. Appl. Phys. 36 (1997) 364
38. Sen R., Chattopadhyay S.K., and Chatterjee S.K. Trans. Indian Inst. Met. 48 (1995) 247
39. Ghosh J., Chattopadhyay S.K., Chatterjee S.K., et al. Bull. Mater. Sci. 29 (2006) 385