Planar defects in massively transformed Ti-Al alloys

Philosophical Magazine Letters

Volumn 79, Issue 8, 1999, Pages 519-530

  Zhang, X D ^a,e   Wiezorek, J M K ^a,d   Kaufman, M J ^b   Loretto, M H ^c   Fraser, H L ^a  

^a Ohio State University   (United States)

^b University of Florida   (United States)

^c UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^d University of Pittsburgh   (United States)

^e ALCOA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DIFFUSION IN SOLIDS; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLOGRAPHIC MICROSTRUCTURE; MORPHOLOGY; RELAXATION PROCESSES; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

DOMAIN BOUNDARIES; THERMAL MICROTWINS; TITANIUM ALUMINUM ALLOYS;

TITANIUM ALLOYS;

EID: 0032667383     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008399176887     Document Type: Article

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