Structural, electrical, and magnetic properties of Mo1-x Fex O2 (x=0-0.05) thin films grown by pulsed laser ablation

Journal of Applied Physics

Volumn 103, Issue 4, 2008, Pages

  Prakash, Ram ^a   Phase, D M ^a   Choudhary, R J ^a   Kumar, Ravi ^b  

^a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

^b Interuniversity Accelerator Center   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; FILM GROWTH; LASER ABLATION; MAGNETIC PROPERTIES; PHASE STRUCTURE; RAMAN SPECTROSCOPY;

DOPED MOLYBDENUM OXIDE; MONOCLINIC STRUCTURE; TEMPERATURE RESISTIVITY;

THIN FILMS;

EID: 40149086060     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2885143     Document Type: Article

References (33)

1. J. Okumu, F. Koerfer, C. Salinga, and M. Wutting, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1728309 95, 7632 (2005).
2. S. H. Mohamed, O. Kappertz, J. M. Nagaruiya, T. P. L. Pedersen, R. Drese, and M. Wutting, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(03)00068-3 429, 135 (2003).
3. J. Okumu, F. Koerfer, C. Salinga, T. P. Pedersen, and M. Wutting, Thin Solid Films THSFAP 0040-6090 515, 1327 (2006).
4. W. Zhang, A. Desikan, and S. T. Oyama, J. Phys. Chem. JPCHAX 0022-3654 10.1021/j100039a039 99, 14468 (1995).
5. R. J. Colton, A. M. Guzman, and J. W. Rabalais, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.324349 49, 409 (1978).
6. J. N. Huiberts, R. Griessen, J. H. Rector, R. J. Wijngaarden, J. P. Dekker, D. G. DeGroot, and N. J. Koeman, Nature (London) NATUAS 0028-0836 10.1038/380231a0 380, 231 (1996).
7. C. Jullien, A. Khelfa, O. M. Hussain, and G. A. Nazri, J. Cryst. Growth JCRGAE 0022-0248 10.1016/0022-0248(95)00269-3 156, 235 (1995).
8. M. A. K. L. Dissnayake and L. L. Chase, Phys. Rev. B PLRBAQ 0556-2805 10.1103/PhysRevB.18.6872 18, 6872 (1978).
9. S. R. Shinde, S. B. Ogale, J. S. Higgins, H. Zheng, A. J. Millis, V. N. Kulkarni, R. Ramesh, R. L. Greene, and T. Vanketation, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92.166601 92, 166601 (2003).
10. S. B. Ogale, R. J. Choudhary, J. P. Buban, S. E. Lofland, S. R. Shinde, S. N. Kale, V. N. Kulkarni, J. Higgins, C. Lanci, J. R. Simpson, N. D. Browning, S. Das Sarma, H. D. Drew, R. L. Greene, and T. Venkatesan, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.91.077205 91, 077205 (2003).
11. R. Kumar, F. Singh, B. Angadi, J.-W. Choi, W.-K. Choi, K. Jeong, J.-H. Song, M. Wasi Khan, J. P. Srivastava, Ajay Kumar, and R. P. Tandon, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2399893 100, 113708 (2006) and reference therein.
12. N. Miyata and S. Akiyoshi, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.336307 58, 1651 (1985).
13. R. S. Patil, M. V. Upane, and P. S. Patil, Appl. Surf. Sci. ASUSEE 0169-4332 252, 8050 (2000).
14. V. Bhosle, A. Tiwari, and J. Narayan, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1868852 97, 083539 (2005).
15. Y. V. PLyuto, I. V. Babich, I. V. Plyuto, A. D. Van Langeveld, and J. A. Moulijn, Appl. Surf. Sci. ASUSEE 0169-4332 10.1016/S0169-4332(97)00185-2 119, 11 (1997).
16. R. Cardenas, J. Torres, and J. E. Alfonso, Thin Solid Films THSFAP 0040-6090 478, 146 (2005).
17. A. Donnadieu, D. Davazoglou, and A. Abdellaoui, Thin Solid Films THSFAP 0040-6090 10.1016/0040-6090(88)90158-7 164, 333 (1988).
18. JCPDS card No. 78-1069 (unpublished).
19. B. D. Cullity, Elements of X-Ray Diffraction (Addison-Wesley, Reading, MA, 1972).
20. A. Fujimori, M. Sekita, and H. Wada, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.33.6652 33, 6652 (1986).
21. T. H. Fleisch and G. J. Mains, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.443047 76, 780 (1980).
22. J.-G. Choi and L. T. Thompson, Appl. Surf. Sci. ASUSEE 0169-4332 10.1016/0169-4332(95)00317-7 93, 143 (1996).
23. M. Sing, R. Neudert, H. von Lips, M. S. Golden, M. Knupfer, J. Fink, R. Claessen, J. Mucke, H. Schmit, S. Hufner, B. Lommel, W. Abmus, Ch. Jung, and C. Hellwig, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.60.8559 60, 8559 (1999).
24. G. K. Wertheim, L. F. Schneemeyer, and D. N. E. Buchanan, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.32.3568 32, 3568 (1985).
25. F. Werfet and E. Minni, J. Phys. C JPSOAW 0022-3719 16, 6019 (1983).
26. Y. L. Leung, P. C. Wong, K. A. R. Mitchell, and K. J. Smith, Appl. Surf. Sci. ASUSEE 0169-4332 136, 147 (1998).
27. A. J. Chen, X. M. Wu, Z. D. Sha, L. J. Zhauge, and Y. D. Meng, J. Phys. D JPAPBE 0022-3727 10.1088/0022-3727/39/22/004 39, 4762 (2006).
28. M. Dieterle and G. Mestl, Phys. Chem. Chem. Phys. PPCPFQ 1463-9076 10.1039/b107046k 4, 822 (2002).
29. L. Kumari, Y. R. Ma, C.-C. Tsai, Y.-W. Lin, S. Y. Wu, K.-W. Cheng, and Y. Liou, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/18/11/115717 18, 115717 (2007).
30. X. Mathew, J. P. Enriquez, C. Mejía-García, G. Contreras-Puente, M. A. Cortes-Jacome, J. A. Toledo Antonio, J. Hays, and A. Punnoose, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2355544 100, 073709 (2006).
31. A. G. Souza Filho, J. L. B. Faria, I. Guedes, J. M. Sasaki, P. T. C. Freire, V. N. Freire, J. M. Filho, M. M. Xavier, Jr., F. A. O. Cabral, J. H. de Araujo, and J. A. P. da Costa, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.67.052405 67, 052405 (2003).
32. J. M. D. Coey, M. Venkatesan, and C. B. Fitzgerald, Nat. Mater. NMAACR 1476-1122 10.1038/nmat1310 4, 173 (2005).
33. N. H. Hong, W. Prellier, J. Sakai, and A. Hassini, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1695103 84, 2850 (2004).