A new single ended sense amplifier for low voltage embedded EEPROM non volatile memories

Records of the IEEE International Workshop on Memory Technology, Design and Testing

Volumn 2002-January, Issue , 2002, Pages 149-153

  Papaix, C ^a,b   Daga, J M ^a  

^a ATMEL Rousset   (France)

^b LIRMM   (France)

Author keywords

CMOS process; Differential amplifiers; Energy consumption; EPROM; Flash memory; Integrated circuit reliability; Logic; Low voltage; Nonvolatile memory; Testing

Indexed keywords

CMOS INTEGRATED CIRCUITS; DATA STORAGE EQUIPMENT; DIFFERENTIAL AMPLIFIERS; ENERGY UTILIZATION; FLASH MEMORY; INTEGRATED CIRCUIT TESTING; TESTING;

CMOS PROCESSS; EPROM; INTEGRATED CIRCUIT RELIABILITY; LOGIC; LOW VOLTAGES; NON-VOLATILE MEMORY;

AMPLIFIERS (ELECTRONIC);

EID: 40049092898     PISSN: 10874852     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.2002.1029776     Document Type: Conference Paper

References (7)

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2. Takeshi Nakayama et al, A 60ns 16Mb Flash EEPROM with Program and Erase Sequence Controller, IEEE J. Solid-States Circuits, vol. 26,no. 11, pp. 1600-1605, Novembre 1991.
3. B. Pathak et al, A 1.8V 64Mb 100MHz Flexible Read While Write Flash Memory, IEEE International Solid-State Circuits Conference, 2001.
4. Nobuashi Otsuka et Mark A. Horowitz, Circuit Techniques for 1.5V Power Supply Flash Memory, IEEE J. Solid-States Circuits, vol. 32, no. 8, pp. 1217-1230.
5. Yasushi Terada et al, 120ns 128Kx8-bit / 64Kx16-bit CMOS EEPROM's, IEEE J. Solid-States Circuits, vol. 24, no. 5, pp. 1224-1249, Octobre 1989.
6. Clinton Kuo et al, A 512-Kb Flash EEPROM Embedded in a 32-b Microcontroller, IEEE J. Solid-States Circuits, vol. 27, no. 4, pp. 574-582, Avril 1992.
7. Marco Pasotti et al, Analog Sense Amplifiers For High Density NOR Flash Memories, IEEE Custom Integrated Circuits Conference, 1998.