Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film

Microwave and Optical Technology Letters

Volumn 50, Issue 3, 2008, Pages 566-568

  Wang, P ^a   Tan, C Y ^a   Ma, Y G ^a   Cheng, W N ^a   Ong, C K ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

BST; Dielectric measurements; Ferroelectric; Interdigital capacitor; Varactor

Indexed keywords

FERROELECTRIC THIN FILMS; PERMITTIVITY;

CONDUCTOR LOSS; DIELECTRIC MEASUREMENTS; INTERDIGITAL CAPACITOR;

CAPACITORS;

EID: 39849097313     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.23141     Document Type: Article

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