Stretched-exponential decay functions from a self-consistent model of dielectric relaxation

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 372, Issue 13, 2008, Pages 2148-2154

  Milovanov, A V ^a   Rasmussen, J J ^b   Rypdal, K ^a  

^a UNIVERSITY OF TROMSØ   (Norway)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Ac universality; Disordered solids; Stretched exponential relaxation

Indexed keywords

DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; EXPONENTIAL FUNCTIONS;

CHARGE TRANSPORT PROCESS; DISORDERED SOLIDS; ESSENTIAL CHARACTERISTIC; FRACTIONAL DERIVATIVES; SELF CONSISTENT MODELING; STRETCHED EXPONENTIAL; STRETCHED EXPONENTIAL DECAY; STRETCHED EXPONENTIAL RELAXATIONS;

DIELECTRIC RELAXATION;

EID: 39849089059     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2007.11.025     Document Type: Article

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