-
1
-
-
56049090988
-
-
Ferguson G., Carroll C.D., Glidewell C., Zakaria C.M., and Lough A.J. Acta Crystallogr. B 51 (1995) 367
-
(1995)
Acta Crystallogr. B
, vol.51
, pp. 367
-
-
Ferguson, G.1
Carroll, C.D.2
Glidewell, C.3
Zakaria, C.M.4
Lough, A.J.5
-
3
-
-
20944434890
-
-
Simoni D., Rossi M., Bertolasi V., Roberti M., Pizzirani D., Rondanin R., Baruchello R., Invidiata F.P., Tolomeo M., Grimaudo S., Merighi S., Varani K., Gessi S., Borea P.A., Marino S., Cavallini S., Bianchi C., and Siniscalchi A. J. Med. Chem. 48 (2005) 3337
-
(2005)
J. Med. Chem.
, vol.48
, pp. 3337
-
-
Simoni, D.1
Rossi, M.2
Bertolasi, V.3
Roberti, M.4
Pizzirani, D.5
Rondanin, R.6
Baruchello, R.7
Invidiata, F.P.8
Tolomeo, M.9
Grimaudo, S.10
Merighi, S.11
Varani, K.12
Gessi, S.13
Borea, P.A.14
Marino, S.15
Cavallini, S.16
Bianchi, C.17
Siniscalchi, A.18
-
4
-
-
39749169268
-
-
H. Hofstetter,O. Hofstetter, unpublished results.
-
H. Hofstetter,O. Hofstetter, unpublished results.
-
-
-
-
10
-
-
0034645592
-
-
Shiotani M., Isamoto N., Hayashi M., Fängström T., and Lunell S. J. Am. Chem. Soc. 122 (2000) 12281
-
(2000)
J. Am. Chem. Soc.
, vol.122
, pp. 12281
-
-
Shiotani, M.1
Isamoto, N.2
Hayashi, M.3
Fängström, T.4
Lunell, S.5
-
15
-
-
0042149036
-
-
Makino T., Orfanopoulos M., You T.P., Wu B., Mosher C.W., and Mosher H.S. J. Org. Chem. 50 (1985) 5357
-
(1985)
J. Org. Chem.
, vol.50
, pp. 5357
-
-
Makino, T.1
Orfanopoulos, M.2
You, T.P.3
Wu, B.4
Mosher, C.W.5
Mosher, H.S.6
-
17
-
-
0242560405
-
-
Altomare A., Burla M.C., Camalli M., Cascarano G.L., Giacovazzo C., Guagliardi A., Moliterni A.G.G., Polidori G., and Spagna R. J. Appl. Cryst. 32 (1999) 115
-
(1999)
J. Appl. Cryst.
, vol.32
, pp. 115
-
-
Altomare, A.1
Burla, M.C.2
Camalli, M.3
Cascarano, G.L.4
Giacovazzo, C.5
Guagliardi, A.6
Moliterni, A.G.G.7
Polidori, G.8
Spagna, R.9
-
18
-
-
39749175799
-
-
G.M. Sheldrick, SHELXTL. Version 6.10, Bruker Analytical X-ray Systems, Madison, Wisconsin, USA, 2005.
-
G.M. Sheldrick, SHELXTL. Version 6.10, Bruker Analytical X-ray Systems, Madison, Wisconsin, USA, 2005.
-
-
-
-
19
-
-
0003401652
-
-
Freie Universität Berlin, Germany
-
Koritsanszky T., Howard S., Mallinson P.R., Su Z., Richter T., and Hansen N.K. XD: A Computer Program Package for Multipole Refinement and Analysis of Electron Densities from Diffraction Data (1995), Freie Universität Berlin, Germany
-
(1995)
XD: A Computer Program Package for Multipole Refinement and Analysis of Electron Densities from Diffraction Data
-
-
Koritsanszky, T.1
Howard, S.2
Mallinson, P.R.3
Su, Z.4
Richter, T.5
Hansen, N.K.6
-
20
-
-
39749111447
-
-
M.J. Frisch, G.W. Trucks, H.B. Schlegel, G.E. Scuseria, J.R.C.M.A. Robb, J.A. Montgomery Jr., T. Vreven, K.N. Kudin, J.C. Burant, J.M. Millam, S.S. Iyengar, J. Tomasi, V. Barone, B. Mennucci, M. Cossi, G. Scalmani, N. Rega, G.A. Petersson, H. Nakatsuji, M. Hada, M. Ehara, K. Toyota, R. Fukuda, J. Hasegawa, M. Ishida, T. Nakajima, Y. Honda, O. Kitao, H. Nakai, M. Klene, X. Li, J.E. Knox, H.P. Hratchian, J.B. Cross, C. Adamo, J. Jaramillo, R. Gomperts, R.E. Stratmann, O. Yazyev, A.J. Austin, R. Cammi, C. Pomelli, J.W. Ochterski, P.Y. Ayala, K. Morokuma, G.A. Voth, P. Salvador, J.J. Dannenberg, V.G. Zakrzewski, S. Dapprich, A.D. Daniels, M.C. Strain, O. Farkas, D.K. Malick, A.D. Rabuck, K. Raghavachari, J.B. Foresman, J.V. Ortiz, Q. Cui, A.G. Baboul, S. Clifford, J. Cioslowski, B.B. Stefanov, G. Liu, A. Liashenko, P. Piskorz, I. Komaromi, R.L. Martin, D.J. Fox, T. Keith, M.A. Al-Laham, C.Y. Peng, A. Nanayakkara, M. Challacombe, P.M.W. Gill, B. Johnson, W. Chen, M.W.
-
M.J. Frisch, G.W. Trucks, H.B. Schlegel, G.E. Scuseria, J.R.C.M.A. Robb, J.A. Montgomery Jr., T. Vreven, K.N. Kudin, J.C. Burant, J.M. Millam, S.S. Iyengar, J. Tomasi, V. Barone, B. Mennucci, M. Cossi, G. Scalmani, N. Rega, G.A. Petersson, H. Nakatsuji, M. Hada, M. Ehara, K. Toyota, R. Fukuda, J. Hasegawa, M. Ishida, T. Nakajima, Y. Honda, O. Kitao, H. Nakai, M. Klene, X. Li, J.E. Knox, H.P. Hratchian, J.B. Cross, C. Adamo, J. Jaramillo, R. Gomperts, R.E. Stratmann, O. Yazyev, A.J. Austin, R. Cammi, C. Pomelli, J.W. Ochterski, P.Y. Ayala, K. Morokuma, G.A. Voth, P. Salvador, J.J. Dannenberg, V.G. Zakrzewski, S. Dapprich, A.D. Daniels, M.C. Strain, O. Farkas, D.K. Malick, A.D. Rabuck, K. Raghavachari, J.B. Foresman, J.V. Ortiz, Q. Cui, A.G. Baboul, S. Clifford, J. Cioslowski, B.B. Stefanov, G. Liu, A. Liashenko, P. Piskorz, I. Komaromi, R.L. Martin, D.J. Fox, T. Keith, M.A. Al-Laham, C.Y. Peng, A. Nanayakkara, M. Challacombe, P.M.W. Gill, B. Johnson, W. Chen, M.W.
-
-
-
-
24
-
-
0003422992
-
-
Gaussian, Inc., Pittsburgh, PA
-
Foresman B., and Frisch Æ. Exploring Chemistry with Electronic Structure Methods. second ed. (1996), Gaussian, Inc., Pittsburgh, PA
-
(1996)
Exploring Chemistry with Electronic Structure Methods. second ed.
-
-
Foresman, B.1
Frisch, Æ.2
|