Structural evolution in three and four-layer Aurivillius solid solutions: A comparative study versus relaxor properties

Solid State Sciences

Volumn 10, Issue 2, 2008, Pages 177-185

  Tellier, Jenny ^a   Boullay, Philippe ^a   Ben Jennet, Dorra ^b   Mercurio, Daniele ^a  

^a UNIVERSITY OF LIMOGES   (France)

^b FACULTÉ DES SCIENCES DE TUNIS   (Tunisia)

Author keywords

Bismuth oxides; Ferroelectrics; Perovskite; Relaxors; Structure refinement; X ray diffraction

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL STRUCTURE; FERROELECTRIC MATERIALS; RIETVELD REFINEMENT; SOLID STATE REACTIONS; X RAY POWDER DIFFRACTION;

FOUR-LAYER AURIVILLIUS COMPOUNDS; RELAXORS; STRUCTURE REFINEMENT;

SOLID SOLUTIONS;

EID: 39549107573     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2007.09.010     Document Type: Article

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