Low-noise CMOS single-photon avalanche diodes with 32 ns dead time

ESSDERC 2007 - Proceedings of the 37th European Solid-State Device Research Conference

Volumn 2007, Issue , 2007, Pages 362-365

  Pancheri, Lucio ^a   Stoppa, David ^a  

^a ITC IRST   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; PHOTONS; PROBABILITY;

AFTERPULSING EFFECTS; GOOD NOISE PERFORMANCE; INTEGRATED QUENCHING CIRCUITS; SINGLE-PHOTON AVALANCHE DIODE DETECTORS;

AVALANCHE DIODES;

EID: 39549085731     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2007.4430953     Document Type: Conference Paper

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