|
Volumn 105, Issue 6, 2004, Pages 667-673
|
Monocrystalline and polycrystalline ZnO and ZnMnO films grown by atomic layer epitaxy - Growth and characterization
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHEMICAL SENSORS;
EPITAXIAL GROWTH;
LAYERED MANUFACTURING;
OPTOELECTRONIC DEVICES;
POLYCRYSTALLINE MATERIALS;
POSITIVE IONS;
PYROLYSIS;
SEMICONDUCTING FILMS;
SEMICONDUCTOR DOPING;
SUBSTRATES;
X RAY ANALYSIS;
ZINC OXIDE;
ATOMIC LAYER EPITAXY;
PIEZOELECTRIC SENSORS;
ZNMNO FILMS;
ZNO FILMS;
SEMICONDUCTING ZINC COMPOUNDS;
|
EID: 3943097985
PISSN: 05874246
EISSN: None
Source Type: Journal
DOI: 10.12693/APhysPolA.105.667 Document Type: Conference Paper |
Times cited : (7)
|
References (10)
|