New method for analysing sensitivity distributions of electroencephalography measurements

Medical and Biological Engineering and Computing

Volumn 46, Issue 2, 2008, Pages 101-108

  Väisänen, Juho ^a   Väisänen, Outi ^a   Malmivuo, Jaakko ^a   Hyttinen, Jari ^a  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

Electroencephalography; Modelling; Region of interest sensitivity ratio; Sensitivity distribution; Signal to noise ratio

Indexed keywords

BIOMEDICAL ENGINEERING; COMPUTER SIMULATION; SENSITIVITY ANALYSIS; SIGNAL TO NOISE RATIO;

REGION OF INTEREST; REGION OF INTEREST SENSITIVITY RATIO; VISUAL EVOKED POTENTIAL MEASUREMENT;

ELECTROENCEPHALOGRAPHY;

ANALYTIC METHOD; ANALYTICAL PARAMETERS; ARTICLE; BRAIN CORTEX; CONTROLLED STUDY; CORRELATION ANALYSIS; ELECTROENCEPHALOGRAPHY; EVOKED VISUAL RESPONSE; MATHEMATICAL COMPUTING; REGION OF INTEREST SENSITIVITY RATIO; SENSITIVITY ANALYSIS; SENSITIVITY AND SPECIFICITY; SIGNAL NOISE RATIO; THEORETICAL MODEL;

ELECTRODES; ELECTROENCEPHALOGRAPHY; HUMANS; MODELS, ANATOMIC; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 39149122168     PISSN: 01400118     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11517-007-0303-x     Document Type: Article

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